ASNT5001-PQC - Obsolete

ASNT5001-PQC - Obsolete View full size
  • Broadband (DC-32Gbps / DC-17GHz) tunable data/clock phase shifter
  • Delay adjustment range of 265ps
  • Exhibits low jitter and limited temperature variation over industrial temperature range
  • 1GHz of bandwidth for the phase adjustment tuning port
  • Fully differential CML input interface
  • Fully differential CML output interface with 600mV single-ended swing
  • Linearized data output for minimized undershoot/overshoot
  • Single +3.3V or -3.3V power supply
  • Power consumption: 1W
  • Fabricated in SiGe for high performance, yield, and reliability
  • Standard MLF/QFN 24-pin package


This product is now considered obsolete.

Documentation and support is still available.

This device has been replaced with the ASNT5001A-PQC.

Function Operating Frequency Power, mW Package
Clock / Data Phase Shifter with Linear OB and 265ps Delay Variation DC-32 Gbps / DC-17 GHz 1000 24-pin QFN


Fig. 1 Functional Block Diagram

ASNT5001-PQC is a clock / data variable delay line fabricated in a SiGe technology. The IC shown in Fig. 1 provides an adjustable delay of its differential output signal outp/outn in relation to its broadband input signal ip/in. The delay adjustment range is temperature-stabilized. The delay is controlled through a wide-band differential tuning port icntp/icntn.


The part’s I/Os support the CML logic interface with on chip 50Ω termination to vcc and may be used differentially, AC/DC coupled, single-ended, or in any combination. In the DC-coupling mode, the input signal's common mode voltage should comply with specifications shown in the electrical characteristics table within the part's datasheet. In the AC-coupling mode, the input termination provides the required common mode voltage automatically. The differential DC signaling mode is recommended for optimal performance, and the output buffer is linearized for reduction of undershoot and overshoot on the output waveforms. Due to an extremely low jitter, the part is suitable for use in high-speed test and measurement equipment.